Berkovich Nanoindentation on AlN Thin Films

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Berkovich Nanoindentation on AlN Thin Films

Berkovich nanoindentation-induced mechanical deformation mechanisms of AlN thin films have been investigated by using atomic force microscopy (AFM) and cross-sectional transmission electron microscopy (XTEM) techniques. AlN thin films are deposited on the metal-organic chemical-vapor deposition (MOCVD) derived Si-doped (2 × 1017 cm-3) GaN template by using the helicon sputtering system. The XTE...

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Berkovich nanoindentation-induced mechanical deformation mechanisms of AlN thin films have been investigated by using atomic force microscopy (AFM) and cross-sectional transmission electron microscopy (XTEM) techniques. AlN thin films are deposited on the metalorganic chemical-vapor deposition (MOCVD) derived Si-doped (2 9 10 cm) GaN template by using the helicon sputtering system. The XTEM sam...

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Dislocation Energetics and Pop-Ins in AlN Thin Films by Berkovich Nanoindentation

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Cathodoluminescence and Cross-sectional Transmission Electron Microscopy Studies for Deformation Behaviors of GaN Thin Films Under Berkovich Nanoindentation

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ژورنال

عنوان ژورنال: Nanoscale Research Letters

سال: 2010

ISSN: 1931-7573,1556-276X

DOI: 10.1007/s11671-010-9582-5